Neurocle

Previously, labeling required significant time and manpower. After implementing Neurolcle’s AI-Assisted labeling, we were able to automate the majority of the labeling process. As a result, both the time and cost associated with labeling were substantially reduced. Improved data quality also led to enhanced performance of our inspection models.

By deploying a high-performance model trained with Auto Deep Learning algorithm to our equipment, we are now able to accurately detect micro defects occurring in semiconductor processes. This has significantly reduced both overkill and underkill in inspection, leading to a marked improvement in overall production efficiency.

By adopting Neurolcle’s software, we built an inspection system capable of detecting micro defects inside tires. The platform enables users to generate deep learning models with ease, even without specialized expertise. As a result, we dramatically shortened model development time while simultaneously improving inspection precision across the production process.