# Electrical Degradation in Dielectric and Piezoelectric Oxides: Review of Defect Chemistry and Associated Characterization Techniques Source: [Electrical Degradation in Dielectric and Piezoelectric Oxides: Review of Defect Chemistry and Associated Characterization Techniques]() Collection index: [llms.txt]() Data updated: 2025-10-25T07:30:36.070Z Authors: Pedram Yousefian, Betul Akkopru-Akgun, Clive A. Randall, Susan Trolier-McKinstry Published: 2024-03-11T01:16:59.000Z ## Abstract The properties of dielectric and piezoelectric oxides are determined by their processing history, crystal structure, chemical composition, microstructure, dopants (or defect) distribution, and defect kinetics. These materials are essential in a diverse range of applications including aerospace, medical, military, transportation, power engineering, and communication, where they are used as ceramic discs, thick and thin films, multilayer devices, etc. Significant advances in understanding the materials, processing, properties, and reliability of these materials have led to their widespread use in consumer electronics, military, and aerospace applications. This review delves into electrical degradation in dielectrics and piezoelectrics, focusing on defect chemistry and key characterization techniques. It also provides a detailed discussion of various spectroscopic, microscopic, and electronic characterization techniques essential for analyzing defects and degradation mechanisms. ## Recorded benchmark results A research result applies to its stated dataset, split, metric and evaluation configuration. Compare like-for-like settings, preserve the metric's unit and direction, and distinguish paper-reported results from independent reproduction. The best result recorded here is not a claim of exhaustive, current global coverage. ## Original sources and implementation [Original paper]() [PDF]()