# Surface recombination and space-charge-limited photocurrent-voltage (PC-V) measurements in (Cd,Mn)Te samples. Kinetics of photocurrent (PC) Source: [Surface recombination and space-charge-limited photocurrent-voltage (PC-V) measurements in (Cd,Mn)Te samples. Kinetics of photocurrent (PC)]() Collection index: [llms.txt]() Data updated: 2025-10-28T13:54:39.275Z Authors: Andrzej Mycielski, Dominika M. Kochanowska, Aneta Wardak, Krzysztof Goscinski, Michal Szot, Witold Dobrowolski, Gabriela Janusz, Malgorzata Gorska, Lukasz Janiak, Wieslaw Czarnacki, Lukasz Swiderski, Joanna Iwanowska-Hanke, Marek Moszynski Published: 2022-02-22T15:52:53.000Z ## Abstract Photocurrent-voltage characteristic (PC-V) is a method of determining the critical parameter in X-ray and gamma-ray detector plates, i.e., the carrier mobility - lifetime product, mt. We show on the (Cd,Mn)Te samples that the measurement results depend strongly on the surface treatment and the charge space distribution. The PC-V characteristics obtained for hv \> Eg and hv ~ Eg indicated that etching with 20% HCl caused an appearance of a significant concentration of very shallow surface traps at the (Cd,Mn)Te sample surface. These traps seriously changed the measurements of PC-V characteristics and PC kinetics. We also noticed a small contribution of holes to photoconductivity in the PC kinetics. The PC-V characteristics measurements for hv \> Eg may test the detector plate surface quality. ## Recorded benchmark results A research result applies to its stated dataset, split, metric and evaluation configuration. Compare like-for-like settings, preserve the metric's unit and direction, and distinguish paper-reported results from independent reproduction. The best result recorded here is not a claim of exhaustive, current global coverage. ## Original sources and implementation [Original paper]() [PDF]()