# Experimental Persistence Probability for Fluctuating Steps

Source: [Experimental Persistence Probability for Fluctuating Steps](<https://www.sota2.com/research/paper/68fa25be2c2a3760193b3552>)

Collection index: [llms.txt](<https://www.sota2.com/research/llms.txt>)

Data updated: 2025-10-24T10:56:31.190Z

Authors: D.B. Dougherty, I. Lyubinetsky, E.D. Williams, M. Constantin, C. Dasgupta, S. Das Sarma

Published: 2002-09-04T16:37:12.000Z

## Abstract

The persistence behavior for fluctuating steps on the $Si(111)$ $(\\sqrt3 \\times \\sqrt3)R30^{0} - Al$ surface was determined by analyzing time-dependent STM images for temperatures between 770 and 970K. The measured persistence probability follows a power law decay with an exponent of $\\theta=0.77 \\pm 0.03$. This is consistent with the value of $\\theta= 3/4$ predicted for attachment/detachment limited step kinetics. If the persistence analysis is carried out in terms of return to a fixed reference position, the measured persistence probability decays exponentially. Numerical studies of the Langevin equation used to model step motion corroborate the experimental observations.

## Recorded benchmark results

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## Original sources and implementation

[Original paper](<https://arxiv.org/abs/cond-mat/0209068>)

[PDF](<https://arxiv.org/pdf/cond-mat/0209068.pdf>)