ResearchDatasetsWafer Defect DatasetFollowBenchmarksTask NameDataset NameSOTA MethodSortMost resultsRecently updatedMost papersApplyTask NameDataset NameSOTA ResultTrendResultsCalibration and Confidence AssessmentWafer Defect Dataset0.04ECE4Object DetectionWafer Defect Dataset78.9Recall2Instance SegmentationWafer Defect Dataset (test)66.8Mask Recall2